<?xml version="1.0"?>
<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/"><rdf:Description rdf:about="https://dk.um.si/IzpisGradiva.php?id=67641"><dc:title>Specific EXAFS tools in analysis of MoSI nanowires</dc:title><dc:creator>Kodre,	Alojz	(Avtor)
	</dc:creator><dc:creator>Padežnik Gomilšek,	Jana	(Avtor)
	</dc:creator><dc:creator>Arčon,	Iztok	(Avtor)
	</dc:creator><dc:creator>Meden,	Anton	(Avtor)
	</dc:creator><dc:creator>Mihailović,	Dragan	(Avtor)
	</dc:creator><dc:subject>EXAFS</dc:subject><dc:subject>nanowires</dc:subject><dc:subject>molybdenum sulphide-iodide</dc:subject><dc:description>The structure of nanowires prepared by vapor synthesis from Mo, S and I is investigated by methods of x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). Starting with a qualitative model of the structure from XRD, the metrics is introduced with interatomic distances determined from EXAFS. Two specific tools to increase the resolution of EXAFS method are discussed: the reciprocity relation between data from adjacent target atoms, and difference EXAFS from data on samples with small changes in stoichiometry.</dc:description><dc:date>2006</dc:date><dc:date>2017-08-25 11:08:10</dc:date><dc:type>Znanstveno delo</dc:type><dc:identifier>67641</dc:identifier><dc:language>sl</dc:language></rdf:Description></rdf:RDF>