Annihilation of highly-charged topological defectsKlemenčič, Eva (Avtor) Kurioz, Pavlo (Avtor) Ambrožič, Milan (Avtor) Rosenblatt, Charles (Avtor) Kralj, Samo (Avtor) liquid crystalstopological defectsannihilationorder reconstructionWe studied numerically external stimuli enforced annihilation of a pair of daughter nematic topological defect (TD) assemblies bearing a relatively strong topological charge |m|=3/2. A Landau- de Gennes phenomenological approach in terms of tensor nematic order parameter was used in an effectively two-dimensional Cartesian coordinate system, where spatial variations along the z-axis were neglected. A pair of {m=3/2,m=−3/2} was enforced by an appropriate surface anchoring field, mimicking an experimental sample realization using the atomic force microscope (AFM) scribing method. Furthermore, defects were confined within a rectangular boundary that imposes strong tangential anchoring. This setup enabled complex and counter-intuitive annihilation processes on varying relevant parameters. We present two qualitatively different annihilation paths, where we either gradually reduced the relative surface anchoring field importance or increased an external in-plane spatially homogeneous electric field E. The creation and depinning of additional defect pairs {12,−12} mediated the annihilation in such a geometry. Furthermore, we illustrate the absorption of TDs by sharp edges of the confining boundary, accompanied by m=±1/4↔∓1/4 winding reversal of edge singularities, and also E-driven zero-dimensional to one-dimensional defect core transformation.MDPI20202025-01-24 10:27:35Znanstveno delo91658sl