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<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/"><rdf:Description rdf:about="https://dk.um.si/IzpisGradiva.php?id=95915"><dc:title>Surface analysis of sodium metamizolate as an active pharmaceutical ingredient in solid form</dc:title><dc:creator>Finšgar,	Matjaž	(Avtor)
	</dc:creator><dc:creator>Varda,	Katja Andrina	(Avtor)
	</dc:creator><dc:subject>matamizole</dc:subject><dc:subject>sodium metamizolate</dc:subject><dc:subject>ToF-SIMS</dc:subject><dc:subject>XPS</dc:subject><dc:subject>surface analysis</dc:subject><dc:subject>API</dc:subject><dc:description>This study focuses on the surface and subsurface characterization of a pharmaceutical tablet containing sodium metamizolate (NaMET), with an emphasis on mass spectrometry using time-of-flight secondary ion mass spectrometry (ToF-SIMS). ToF-SIMS enabled the identification of NaMET-specific fragment ions, which served as signals for the determination of the spatial distribution of this active pharmaceutical ingredient (API) within the tablet matrix. A ToF-SIMS fragmentation mechanism for NaMET was proposed based on the ToF-SIMS spectra analysis measured on a NaMET reference standard. 3D ToF-SIMS imaging showed heterogeneous localization of the API across a 5 μm depth. Complementary techniques, including 3D profilometry and atomic force microscopy (AFM), provided surface roughness and morphological data, while X-ray photoelectron spectroscopy (XPS) confirmed the elemental composition and chemical states. Depth profiling by XPS further supported the non-uniform distribution of NaMET.</dc:description><dc:publisher>Elsevier B. V.</dc:publisher><dc:date>2026</dc:date><dc:date>2025-11-10 08:59:30</dc:date><dc:type>Članek v reviji</dc:type><dc:identifier>95915</dc:identifier><dc:language>sl</dc:language><dc:rights>© 2025 The Authors</dc:rights></rdf:Description></rdf:RDF>
