Assessing the potential of electrochemical impedance spectroscopy as a supporting tool for equivalent circuit modeling in battery management systemsBatiuk, Denis (Avtor) Mele, Igor (Avtor) Zelič, Klemen (Avtor) Pec, Martin (Avtor) Katrašnik, Tomaž (Avtor) Chowdhury, Amor (Avtor) electrochemical impedance spectroscopybattery management systemequivalent circuit modelsphysics-based modelslithium-ion batteriesfrequency-domain analysisparameter identificationdiagnosticsAccurate yet computationally efficient battery models are essential for industrial battery management systems (BMS), which operate under strict constraints on sensing and processing power, as well as certification requirements. Electrical equivalent circuit models (ECMs) are therefore adopted widely in practice, while physics-based models (PBMs) provide detailed descriptions of transport, kinetic, and degradation processes, but are not yet adopted in embedded implementation. The present work assesses the potential of electrochemical impedance spectroscopy (EIS) as a supporting tool for equivalent circuit modeling in BMS applications, with an emphasis on its ability to provide frequency-resolved, process-level indications rather than direct parameter information. By separating the ohmic, charge-transfer, and diffusion-related contributions in the frequency domain, EIS offers complementary insights that are not accessible through time-domain measurements alone. The analysis addresses how such indications can guide ECM structure selection and parameter interpretation, the limitations imposed by measurement duration, noise, and temperature gradients, and the feasibility of EIS-supported modeling approaches under typical BMS constraints. The results delineate the scope within which frequency- informed modeling can enhance physical consistency and diagnostic interpretability while preserving the computational characteristics required for BMS implementation.20262026-07-17 09:03:38Znanstveno delo98913UDK: 621.355.8:004.94:621.317.33COBISS_ID: 285069827DOI: 10.18690/jet.19.1.83-108.2026ISSN pri članku: 1855-5748sl