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Title:RAZVOJNO TESTIRANJE RFID ZNAČKE
Authors:ID Štraus, Darko (Author)
ID Pleteršek, Anton (Mentor) More about this mentor... New window
ID Kramberger, Iztok (Comentor)
Files:.pdf UNI_Straus_Darko_2009.pdf (1,37 MB)
MD5: DFDB0DDEF42D19502822BD012D10C37F
PID: 20.500.12556/dkum/b2f5df69-d732-4dc0-bec2-3113f21b3d61
 
Language:Slovenian
Work type:Undergraduate thesis
Organization:FERI - Faculty of Electrical Engineering and Computer Science
Abstract:V diplomski nalogi je predstavljeno razvojno testiranje integriranega vezja za RFID značko, ki ima dodatno funkcionalnost za zajemanje podatkov integriranih in zunanjih analognih senzorjev in jo imenujemo pametna nalepka SAL. Na kratko so opisane osnove delovanja RFID sistemov in njihove komponente. Predstavljena je priprava testnega sistema, ki ga sestavlja testno vezje in programska oprema za izvajanje meritev. Predstavljene so metode, ki so bile uporabljene za merjenje integriranega vezja in nekateri rezultati meritev. Zgradba merjenca, integriranega vezja SAL_UHF, je predstavljena z blokovnimi diagrami. V diplomski nalogi smo se omejili na testiranje nekaterih funkcij integriranega vezja, saj bi bilo testiranje vseh funkcij za diplomsko nalogo preobsežna dokumentacija. Namen diplomske naloge je temeljito in zanesljivo meriti parametre in funkcionalnost integriranega vezja.
Keywords:izpraševalnik, značka, pametna nalepka, aktivna nalepka, pasivna nalepka, RFID, EPC-GEN2, parametrični test, funkcionalni test
Place of publishing:Maribor
Publisher:[D. Štraus]
Year of publishing:2009
PID:20.500.12556/DKUM-11524 New window
UDC:621.396/.398(043.2)
COBISS.SI-ID:7291732 New window
NUK URN:URN:SI:UM:DK:SNDWITKA
Publication date in DKUM:09.09.2009
Views:2451
Downloads:232
Metadata:XML DC-XML DC-RDF
Categories:KTFMB - FERI
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Secondary language

Language:English
Title:DEVELOPMENT TESTING OF AN RFID TAG
Abstract:This work describes development testing of integrated circuit for RFID tag, which is also capable of capturing data with integrated internal or external sensors. Such devices are called smart active label – SAL. Basics of RFID system and its components are briefly described. Making of testing system, which is made of testing circuit and software, is described. Methods used and some measurement results are also presented. Structure of the measured object, integrated circuit SAL_UHF, is presented with block diagrams. Only testing of some functions of integrated circuit are described in this work, since testing all functions would produce too much data for this paper. The purpose of this work is to thoroughly and reliably measure parameters and functionality of integrated circuit.
Keywords:reader, tag, smart label, active label, passive label, RFID, EPC-GEN2, parametric test, functional test


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