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Title:Combined edge detection using wavelet transform and signal registration
Authors:ID Heric, Dušan (Author)
ID Zazula, Damjan (Author)
Files:URL http://dx.doi.org/10.1016/j.imavis.2006.05.008
 
Language:English
Work type:Unknown
Typology:1.01 - Original Scientific Article
Organization:FERI - Faculty of Electrical Engineering and Computer Science
Abstract:This paper presents a novel edge detection algorithm, using Haar wavelet transform and signal registration. The proposed algorithm has two stages: (a) adaptive edge detection with the maximum entropy thresholding technique on time-scale plane and (b) edge linkage into a con tour line with signal registration in order to c1ose edge discontinuities and calculate a confidence index for contour linkages. This index measures the level of confidence in the linkage of two adjacent points in the con tour structure. Experimenting with synthetic images, we found out the lower level of confidence can be set to approximately e-2. The method was tested on 200 synthetic images at different signal-to-noise ratios (SNRs) and II clinical images. We assessed its reliability, accuracy and robustness using the mean absolute distance (MAD) metric and our confidence index. The results for MAD on synthetic images yield the mean of 0.7 points and standard deviation (std) of 0.14, while the mean confidence level is 0.48 with std of 0.19 (the values are averaged over SNRs from 3 to 50 dB each in 20 Monte-Carlo runs). Our assessment on clinical images, where the references were expert's annotations, give MAD equal1.36:1:: 0.36 (mean :1:: std) and confidence level equal 0.67 :1:: 0.25 (mean :1:: std).
Keywords:edge model, edge detection, wavelet transform, signal registration
Year of publishing:2006
PID:20.500.12556/DKUM-25779 New window
UDC:004.92
ISSN on article:0262-8856
COBISS.SI-ID:10862614 New window
NUK URN:URN:SI:UM:DK:P91ZOCRO
Publication date in DKUM:31.05.2012
Views:2509
Downloads:111
Metadata:XML DC-XML DC-RDF
Categories:Misc.
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Record is a part of a journal

Title:Image and vision computing
Shortened title:Image vis. comput.
Publisher:Butterworth Scientific
ISSN:0262-8856
COBISS.SI-ID:25590016 New window

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