| Title: | Prototype of integrated circuits testing device : magistrsko delo |
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| Authors: | ID Kačič, Luka (Author)
ID Kramberger, Iztok (Mentor) More about this mentor...  |
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| Files: |  MAG_Kacic_Luka_2023.pdf (13,74 MB)
MD5: 60CA074B06867EB2825BB7790A3B6F7B
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| Language: | English |
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| Work type: | Master's thesis/paper |
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| Typology: | 2.09 - Master's Thesis |
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| Organization: | FERI - Faculty of Electrical Engineering and Computer Science
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| Abstract: | The field of electronics is constantly evolving, and this master's thesis aims to explore the latest developments and investigate their potential impact on various applications. The research covers topics such as semiconductor devices, integrated circuits, communication systems, and digital signal processing. Based on extensive literature review, theoretical analysis, and experimental investigations, the thesis provides valuable insights into the latest trends in electronics and testing, especially in the automotive industry. The project's focus is on the development of a prototype testing device for integrated circuits in cooperation with company NXP Semiconductors Austria GmbH & Co KG. The device needs to effectively find failures in the investigated integrated circuit's digital section and offer powerful forcing and measuring options to verify the analog parameters. The solution developed includes a configurable Serial Peripheral Interface (SPI) master node communication block and a Graphical User Interface (GUI). Effective communication is essential for any electronic system, and the importance of communication continues to grow with technology advances. I have demonstrated the versatility of LabVIEW as a programming tool for FPGAs and IC testing, providing an effective and user-friendly environment for electronics engineers to develop and test. By enhancing the efficiency and accuracy of IC testing, the work can help manufacturers and engineers accelerate their testing processes, reduce costs, and improve product quality. I have gained a deeper understanding of the challenges involved in electronics testing and the importance of efficient testing processes. The research makes a meaningful contribution to the field of electronics engineering and has the potential to shape the future of electronics testing and improve the reliability and performance of electronic devices. |
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| Keywords: | state machine, SPI, FPGA, LabVIEW |
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| Place of publishing: | Maribor |
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| Place of performance: | Maribor |
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| Publisher: | [L. Kačič] |
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| Year of publishing: | 2023 |
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| Number of pages: | 1 spletni vir (1 datoteka PDF (XIV, 75 f.)) |
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| PID: | 20.500.12556/DKUM-83952 |
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| UDC: | 621,3.049.77(043.2) |
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| COBISS.SI-ID: | 151842051 |
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| Publication date in DKUM: | 30.03.2023 |
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| Views: | 1021 |
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| Downloads: | 10 |
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| Metadata: |    |
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| Categories: | KTFMB - FERI
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