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Naslov:Microstructure and surface topography study of nanolayered TiAlN/CrN hard coating
Avtorji:ID Panjan, Peter (Avtor)
ID Gselman, Peter (Avtor)
ID Panjan, Matjaž (Avtor)
ID Bončina, Tonica (Avtor)
ID Drnovšek, Aljaž (Avtor)
ID Albu, Mihaela (Avtor)
ID Čekada, Miha (Avtor)
ID Zupanič, Franc (Avtor)
Datoteke:.pdf coatings-12-01725-v4.pdf (6,54 MB)
MD5: 42C5B4CC10BB904937360838238B7CA9
 
URL https://www.mdpi.com/2079-6412/12/11/1725
 
Jezik:Angleški jezik
Vrsta gradiva:Članek v reviji
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:FS - Fakulteta za strojništvo
Opis:The microstructure and surface topography of PVD hard coatings are among the most important properties, as they significantly determine their mechanical, tribological and other properties. In this study, we systematically analyzed the microstructure and topography of a TiAlN/CrN nanolayer coating (NL-TiAlN/CrN), not only because such coatings possess better mechanical and tribological properties than TiAlN and CrN monolayer coatings, mainly because the contours of the individual layers, in the cross-sectional STEM or SEM images of such coatings, make it easier to follow topographic and microstructural changes that occurred during its growth. We investigated the effects of the substrate rotation modes on the microstructure and surface topography of the NL-TiAlN/CrN coating, as well as on the periodicity of the nanolayer structure. The influence of the substrate material and the ion etching methods were also studied, while special attention was given to the interlayer roughness and influence of non-metallic inclusions in the steel substrates on the growth of the coating. The topographical features of the NL-TiAlN/CrN coating surface are correlated with the observations from the cross-sectional TEM and FIB analysis. Selected non-metallic inclusions, covered by the NL-TiAlN/CrN coating, were prepared for SEM and STEM analyses by the focused ion beam. The same inclusions were analyzed prior to and after deposition. We found that substrate rotation modes substantially influence the microstructure, surface topography and periodicity of the NL-TiAlN/CrN layer. Non-metallic inclusions in the substrates cause the formation of shallow craters or protrusions, depending on their net removal rates during the substrate pretreatment (polishing and ion etching), as compared to the matrix.
Ključne besede:magnetron sputtering, nanolayer hard coatings, growth defects, surface topography, interlayer roughness, non-metallic inclusion, focused ion beam (FIB), scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM)
Status publikacije:Objavljeno
Verzija publikacije:Objavljena publikacija
Poslano v recenzijo:12.10.2022
Datum sprejetja članka:08.11.2022
Datum objave:11.11.2022
Založnik:MDPI AG
Leto izida:2022
Št. strani:str. 1725-1-1725-19
Številčenje:Vol. 12, no. 11
PID:20.500.12556/DKUM-92185 Novo okno
UDK:620.3
COBISS.SI-ID:129057539 Novo okno
DOI:10.3390/coatings12111725 Novo okno
ISSN pri članku:2079-6412
Avtorske pravice:© 2022 by the authors
Datum objave v DKUM:19.03.2025
Število ogledov:213
Število prenosov:12
Metapodatki:XML DC-XML DC-RDF
Področja:Ostalo
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Vaša ocena:Ocenjevanje je dovoljeno samo prijavljenim uporabnikom.
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Gradivo je del revije

Naslov:Coatings
Skrajšan naslov:Coatings
Založnik:MDPI AG
ISSN:2079-6412
COBISS.SI-ID:523035673 Novo okno

Gradivo je financirano iz projekta

Financer:ARIS - Javna agencija za znanstvenoraziskovalno in inovacijsko dejavnost Republike Slovenije
Številka projekta:P2-0082-2022
Naslov:Tankoplastne strukture in plazemsko inženirstvo površin

Financer:ARIS - Javna agencija za znanstvenoraziskovalno in inovacijsko dejavnost Republike Slovenije
Številka projekta:J2-2509-2020
Naslov:Samoorganizacija plazme v razelektritvah magnetronskega naprševanja

Financer:CENN Nanocenter
Program financ.:the European Regional Development Funds
Številka projekta:OP13.1.1.2.02.006

Financer:Drugi - Drug financer ali več financerjev
Program financ.:the European Union Seventh Framework Programme
Številka projekta:312483-ESTEEM2
Naslov:Integrated Infrastructure Initiative-I3

Licence

Licenca:CC BY 4.0, Creative Commons Priznanje avtorstva 4.0 Mednarodna
Povezava:http://creativecommons.org/licenses/by/4.0/deed.sl
Opis:To je standardna licenca Creative Commons, ki daje uporabnikom največ možnosti za nadaljnjo uporabo dela, pri čemer morajo navesti avtorja.

Sekundarni jezik

Jezik:Slovenski jezik
Ključne besede:mikrostruktura, nanoplastne trde prevleke, topografija površin, fokusirani ionski snop, vrstična elektronska mikroskopija


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