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Title:Microstructure and surface topography study of nanolayered TiAlN/CrN hard coating
Authors:ID Panjan, Peter (Author)
ID Gselman, Peter (Author)
ID Panjan, Matjaž (Author)
ID Bončina, Tonica (Author)
ID Drnovšek, Aljaž (Author)
ID Albu, Mihaela (Author)
ID Čekada, Miha (Author)
ID Zupanič, Franc (Author)
Files:.pdf coatings-12-01725-v4.pdf (6,54 MB)
MD5: 42C5B4CC10BB904937360838238B7CA9
 
URL https://www.mdpi.com/2079-6412/12/11/1725
 
Language:English
Work type:Article
Typology:1.01 - Original Scientific Article
Organization:FS - Faculty of Mechanical Engineering
Abstract:The microstructure and surface topography of PVD hard coatings are among the most important properties, as they significantly determine their mechanical, tribological and other properties. In this study, we systematically analyzed the microstructure and topography of a TiAlN/CrN nanolayer coating (NL-TiAlN/CrN), not only because such coatings possess better mechanical and tribological properties than TiAlN and CrN monolayer coatings, mainly because the contours of the individual layers, in the cross-sectional STEM or SEM images of such coatings, make it easier to follow topographic and microstructural changes that occurred during its growth. We investigated the effects of the substrate rotation modes on the microstructure and surface topography of the NL-TiAlN/CrN coating, as well as on the periodicity of the nanolayer structure. The influence of the substrate material and the ion etching methods were also studied, while special attention was given to the interlayer roughness and influence of non-metallic inclusions in the steel substrates on the growth of the coating. The topographical features of the NL-TiAlN/CrN coating surface are correlated with the observations from the cross-sectional TEM and FIB analysis. Selected non-metallic inclusions, covered by the NL-TiAlN/CrN coating, were prepared for SEM and STEM analyses by the focused ion beam. The same inclusions were analyzed prior to and after deposition. We found that substrate rotation modes substantially influence the microstructure, surface topography and periodicity of the NL-TiAlN/CrN layer. Non-metallic inclusions in the substrates cause the formation of shallow craters or protrusions, depending on their net removal rates during the substrate pretreatment (polishing and ion etching), as compared to the matrix.
Keywords:magnetron sputtering, nanolayer hard coatings, growth defects, surface topography, interlayer roughness, non-metallic inclusion, focused ion beam (FIB), scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM)
Publication status:Published
Publication version:Version of Record
Submitted for review:12.10.2022
Article acceptance date:08.11.2022
Publication date:11.11.2022
Publisher:MDPI AG
Year of publishing:2022
Number of pages:str. 1725-1-1725-19
Numbering:Vol. 12, no. 11
PID:20.500.12556/DKUM-92185 New window
UDC:620.3
ISSN on article:2079-6412
COBISS.SI-ID:129057539 New window
DOI:10.3390/coatings12111725 New window
Copyright:© 2022 by the authors
Publication date in DKUM:19.03.2025
Views:216
Downloads:12
Metadata:XML DC-XML DC-RDF
Categories:Misc.
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Record is a part of a journal

Title:Coatings
Shortened title:Coatings
Publisher:MDPI AG
ISSN:2079-6412
COBISS.SI-ID:523035673 New window

Document is financed by a project

Funder:ARIS - Slovenian Research and Innovation Agency
Project number:P2-0082-2022
Name:Tankoplastne strukture in plazemsko inženirstvo površin

Funder:ARIS - Slovenian Research and Innovation Agency
Project number:J2-2509-2020
Name:Samoorganizacija plazme v razelektritvah magnetronskega naprševanja

Funder:CENN Nanocenter
Funding programme:the European Regional Development Funds
Project number:OP13.1.1.2.02.006

Funder:Other - Other funder or multiple funders
Funding programme:the European Union Seventh Framework Programme
Project number:312483-ESTEEM2
Name:Integrated Infrastructure Initiative-I3

Licences

License:CC BY 4.0, Creative Commons Attribution 4.0 International
Link:http://creativecommons.org/licenses/by/4.0/
Description:This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.

Secondary language

Language:Slovenian
Keywords:mikrostruktura, nanoplastne trde prevleke, topografija površin, fokusirani ionski snop, vrstična elektronska mikroskopija


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