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Naslov:Enhancing calibration accuracy with laser interferometry for high-resolution measuring systems
Avtorji:ID Črepinšek-Lipuš, Lucija (Avtor)
ID Ačko, Bojan (Avtor)
ID Klobučar, Rok (Avtor)
Datoteke:.pdf APEM19-3_386-394.pdf (1,32 MB)
MD5: 64073FCA1DB4AB0CBE53740778F4E0BB
 
URL https://apem-journal.org/Archives/2024/Abstract-APEM19-3_386-394.html
 
Jezik:Angleški jezik
Vrsta gradiva:Članek v reviji
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:FS - Fakulteta za strojništvo
Opis:This paper presents an analysis of the measurement capability of laser interferometry for calibrating high-resolution measuring systems, focusing on potential errors that need to be carefully controlled to ensure adequate metrological traceability. The primary scientific research focus of our National Dimensional Metrology Laboratory is the development of metrological applications for industry, with ongoing improvements in calibration procedures for measuring machines and tools. Through a review of possible error sources, an innovative approach to reducing the most significant factors is proposed. This is specifically applied to the following calibration cases: field calibration of coordinate measuring machines, and laboratory calibration of precision probes and line scales. Instrumental and environmental errors can be effectively mitigated by using periodically calibrated laser interferometers in well-controlled air conditions, ensuring an uncertainty of 0.2 μm/m. Most geometrical errors can be minimized by precise adjustments to the interferometry and positioning systems, achieving an uncertainty of 0.3 μm/m. However, errors caused by temperature differences in the material along the measuring path remain the most influential. These arise due to the high expansion coefficient of the material and some uncertainty in its properties. After several hours of temperature stabilization, using three temperature sensors along the displacement range for software compensation, temperature differences still contribute significantly to measurement uncertainty. For example, the error is 0.5 μm/min in the case of line scale calibration and 1.1 μm/m for coordinate measuring machine calibration.
Ključne besede:laser interferometry, high resolution measurements, measurement uncertainty, dimensional metrology, coordinate measuring machine, precise probe, line scale
Status publikacije:Objavljeno
Verzija publikacije:Objavljena publikacija
Poslano v recenzijo:24.07.2024
Datum sprejetja članka:28.10.2024
Datum objave:31.10.2024
Založnik:Chair of Production Engineering (CPE), University of Maribor Faculty of Mechanical Engineering
Leto izida:2024
Št. strani:str. 386-394
Številčenje:Vol. 19, no. 3
PID:20.500.12556/DKUM-96930 Novo okno
UDK:006.915
COBISS.SI-ID:220036867 Novo okno
DOI:10.14743/apem2024.3.514 Novo okno
ISSN pri članku:1854-6250
Avtorske pravice:Content from this work may be used under the terms of the Creative Commons Attribution 4.0 International Licence (CC BY 4.0). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Datum objave v DKUM:03.02.2026
Število ogledov:205
Število prenosov:66
Metapodatki:XML DC-XML DC-RDF
Področja:Ostalo
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Gradivo je del revije

Naslov:Advances in production engineering & management
Skrajšan naslov:Adv produc engineer manag
Založnik:Fakulteta za strojništvo, Inštitut za proizvodno strojništvo
ISSN:1854-6250
COBISS.SI-ID:229859072 Novo okno

Gradivo je financirano iz projekta

Financer:ARIS - Javna agencija za znanstvenoraziskovalno in inovacijsko dejavnost Republike Slovenije
Številka projekta:P2-0190
Naslov:Napredni koncepti menedžmenta proizvodnje in dimenzionalnega meroslovja

Financer:the Metrology Institute of the Republic of Slovenia
Številka projekta:Contract No. C3212-10-000072

Financer:the Republic of Slovenia, the Ministry of Education, Science and Sport and the European Union
Program financ.:the European Regional Development Fund
Naslov:Upgrading national research infrastructures – RIUM (Laser measuring systems for machine tools and coordinate measuring machines)

Licence

Licenca:CC BY 4.0, Creative Commons Priznanje avtorstva 4.0 Mednarodna
Povezava:http://creativecommons.org/licenses/by/4.0/deed.sl
Opis:To je standardna licenca Creative Commons, ki daje uporabnikom največ možnosti za nadaljnjo uporabo dela, pri čemer morajo navesti avtorja.

Sekundarni jezik

Jezik:Slovenski jezik
Ključne besede:laserska interferometrija, meritve visoke ločljivosti, merilna negotovost, dimenzijsko meroslovje, koordinatni merilni stroj, natančna sonda, črtno merilo


Zbirka

To gradivo je del naslednjih zbirk del:
  1. Advances in production engineering & management

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