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Title:Tehnologija fokusiranega ionskega curka (FIB)
Authors:ID Zupanič, Franc (Author)
Files:URL http://www.dlib.si/details/URN:NBN:SI:doc-346GX77M
 
Language:Slovenian
Work type:Not categorized
Typology:1.04 - Professional Article
Organization:FS - Faculty of Mechanical Engineering
Abstract:Fokusirani ionski curek (FIB) ima premer od 5 nm do nekaj mikrometrov. Ko ga uporabljamo kot mikroskop, je njegova ločljivost nekoliko slabša, kot je ločljivost vrstičnega elek- tronskega mikroskopa, vendar ima bistveno boljši orientacijski kontrast. Z njim lahko odvzemamo ali nanašamo material na izbranih mestih z natančnostjo vsaj 100 nm. Ta značilnost omogoča, da se uporablja v najrazličnejše namene, od popravila elektronskih vezij, preko 3D-mikroskopije, do izdelave najrazličnejših 3D-objektov v nano- in mikrometrskem področju. Kombinacija fokusiranega ionskega curka in vrstičnega elektronskega mikroskopa bistveno izboljša zmogljivosti obeh.
Keywords:fokusirani ionski curek, mikroskop, odvzemanje materiala, nanašanje materiala
Publisher:Društvo za vakuumsko tehniko Slovenije
Year of publishing:2006
Number of pages:str. 4-9
Numbering:Letn. 26, št. 4
PID:20.500.12556/DKUM-52975 New window
UDC:531/533
ISSN on article:0351-9716
COBISS.SI-ID:11145750 New window
NUK URN:URN:SI:UM:DK:95GT5V0O
Publication date in DKUM:10.07.2015
Views:2040
Downloads:54
Metadata:XML DC-XML DC-RDF
Categories:Misc.
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Record is a part of a journal

Title:Vakuumist
Shortened title:Vakuumist
Publisher:Društvo za vakuumsko tehniko Slovenije
ISSN:0351-9716
COBISS.SI-ID:16059650 New window

Secondary language

Language:English
Title:Technology of focussed ion beam (FIB)
Abstract:Focussed ion beam has a diameter between 5 nm and a few micrometers. Its resolution is slightly worse than that of a scanning electron microscope; however, it possesses much better orientation contrast. It allows site-specific sputtering and deposition of materials with precision of at least 100 nm. This ability allows FIB application in different fields: repairing of electronic circuits, 3D-microscopy, 3D-fabrication of objects in nano- and micro regions. The combination of a scanning electron microscopeand a FIB provides enhanced capabilities of both.


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