| Title: | Mixed-field radiation of 3-D MLC flash memories for space applications |
|---|
| Authors: | ID Gonzales, Lorenzo (Author)
ID Danzeca, Salvatore (Author)
ID Fiore, Salvatore (Author)
ID Kramberger, Iztok (Author) |
|---|
| Files: |  Mixed-Field_Radiation_of_3-D_MLC_Flash_Memories_for_Space_Applications.pdf (9,44 MB)
MD5: B478FEB719F8B85AA66856D36B566BF1
 https://ieeexplore.ieee.org/document/10706133
|
|---|
| Language: | English |
|---|
| Work type: | Article |
|---|
| Typology: | 1.01 - Original Scientific Article |
|---|
| Organization: | FERI - Faculty of Electrical Engineering and Computer Science
|
|---|
| Abstract: | This article presents the results of dynamic measurements of 3-D multilevel cell (MLC) NAND flash memories in a mixed-field radiation facility CERN High-energy AcceleRator Mixed field/facility (CHARM), CERN. The results show that the behavior of devices is comparable to tests with specific high energy particles, such as high energy protons, heavy ions, and to TID tests. The observed TID and single-event effects (SEEs) in flash memories from the existing relevant work are also observed in mixed field, making the environment suitable for an accelerated system level test. As the CHARM hadron energy spectrum is comparable to the low Earth orbit (LEO) environment, the facility is appropriate as an accelerated test for space applications. Furthermore, the volumetric characteristics of the devices can be observed in this 3-D radiation facility. Additionally, bad bit (BB) spread was observed, and the necessary radiation induced errors in NAND devices are discussed. |
|---|
| Keywords: | bit error rate, flkash memories, memory controller, mixed field facility, multilevel cell, MLC, radiation hardness, single-event upsets, SEUs, space applications, total ionizing dose |
|---|
| Publication status: | Published |
|---|
| Publication version: | Version of Record |
|---|
| Submitted for review: | 26.08.2024 |
|---|
| Article acceptance date: | 02.10.2024 |
|---|
| Publication date: | 07.10.2024 |
|---|
| Publisher: | Professional Technical Group on Nuclear Science |
|---|
| Year of publishing: | 2024 |
|---|
| Number of pages: | str. 2400-2408 |
|---|
| Numbering: | Vol. 71, iss. 11 |
|---|
| PID: | 20.500.12556/DKUM-91763  |
|---|
| UDC: | 621.39:629.7 |
|---|
| ISSN on article: | 1558-1578 |
|---|
| COBISS.SI-ID: | 215735043 |
|---|
| DOI: | 10.1109/TNS.2024.3474746 |
|---|
| Copyright: | © 2024 The Authors |
|---|
| Publication date in DKUM: | 03.02.2025 |
|---|
| Views: | 188 |
|---|
| Downloads: | 21 |
|---|
| Metadata: |    |
|---|
| Categories: | Misc.
|
|---|
|
:
|
Copy citation |
|---|
| | | | Average score: | (0 votes) |
|---|
| Your score: | Voting is allowed only for logged in users. |
|---|
| Share: |  |
|---|
Hover the mouse pointer over a document title to show the abstract or click
on the title to get all document metadata. |
